|
|
|
COAX GROUP CORPORATION LTD
1131/62, 64, 325-328 Nakornchaisri Rd.
Thanonnakornchaisri, Dusit
10300 Bangkok
Thailand
Tel: (66) 2668 2436 to 9
Fax: (66) 2243 7386
Email:
Website: www.coax.co.th
Contact
Khun Sawita Srivises, General Manager
Email: sawita@coax.co.th
|
|
| Products & Services |
 |
Scanning Electron Microscope (SEM)
Brand: Hitachi
Model: SU3800/SU3900
Performance & Power in a Flexible Platform
Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
1. Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples
§ Robust Stage for Flexibility in Sample Size, Shape, and Weight
- The specimen exchange sequence prevents potential damage to the system or the sample.
- Exchange the specimens without venting the specimen chamber, improving throughput.
- Increase sample manipulation with Stage Free Mode*.
- The Chamber Scope enhances the safety of stage movements*.
§ Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation
- Integrated in-chamber camera display
- Easily navigate the entire observable area
- Detector-oriented rotation
2. Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level
§ Multiple Modes of Operation
§ Automatic Functions for Operators of Any Skill Level
- Improved auto algorithms—3X faster (compared with the Hitachi Model S-3700N)
- Improved auto focus function
- Features of our proprietary Intelligent Filament Technology (IFT):
§ Multi Zigzag enables wide-area observation across multiple areas.
§ Report Creator generates reports of acquired data.
3. Integrated Solutions for Various Applications
§ A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber.
§ SEM/EDS Integration System*
§ High Sensitivity Detectors Supporting All Observation Requirements
- CL observation Using UVD*
- Segmented BSED allows for visualizing composition and topography.
§ STEM Holder
§ 3D Modeling Software: Hitachi map 3D*
§ Image Processing, Measurement, and Analysis Software: Image-Pro® for Hitachi
*optional
|
|
 |
|
Other Products & Services
|
|
COAX GROUP CORPORATION LTD (โคแอกซ์ กรุป คอร์ปอเรชั่น บจก.) |
|
|
|
